On Mon, 23 Oct 2023 11:52:40 -0700 (PDT), John Smiht <utube.jocjo@xoxy.net> wrote:>I have not finished watching this but I will give you the link anyway: > >https://www.youtube.com/watch?v=CnpqkuHU0pc > >Concerns degradation of SiC FETs under pulse conditions. I hope this is interesting for you. (or anyone else, for that matter)Tests on two devices at two different temperatures is largely meaningless. The presenting the full results might make more sense. RL
Ping John Larkin - SiC FETs
Started by ●October 23, 2023
Reply by ●October 25, 20232023-10-25
Reply by ●October 25, 20232023-10-25
On Mon, 23 Oct 2023 11:52:40 -0700 (PDT), John Smiht <utube.jocjo@xoxy.net> wrote:>I have not finished watching this but I will give you the link anyway: > >https://www.youtube.com/watch?v=CnpqkuHU0pc > >Concerns degradation of SiC FETs under pulse conditions. I hope this is interesting for you. (or anyone else, for that matter)EPC employs pulse testing to determine reliability. https://epc-co.com/epc/DesignSupport/eGaNFETReliability/ReliabilityReportPhase14.aspx RL
Reply by ●October 26, 20232023-10-26
On a sunny day (Wed, 25 Oct 2023 12:00:33 -0400) it happened legg <legg@nospam.magma.ca> wrote in <dpeiji107glkvnbp920osuko256lqm6ifo@4ax.com>:>On Mon, 23 Oct 2023 11:52:40 -0700 (PDT), John Smiht ><utube.jocjo@xoxy.net> wrote: > >>I have not finished watching this but I will give you the link anyway: >> >>https://www.youtube.com/watch?v=CnpqkuHU0pc >> >>Concerns degradation of SiC FETs under pulse conditions. I hope this is interesting for you. (or anyone else, for that matter) > > >EPC employs pulse testing to determine reliability. > >https://epc-co.com/epc/DesignSupport/eGaNFETReliability/ReliabilityReportPhase14.aspxThank you, nice report.
